NIST
Jonathan Wyrick is an experimental physicist at the National Institute of Standards and Technology (NIST) in the Atom Scale Devices Group, Nanoscale Device Characterization Division (NDCD). He performs fundamental research on atomically-defined quantum structures and devices in silicon. He specializes in the application of density functional theory calculations combined with low temperature ultra high vacuum scanning tunneling microscopy and spectroscopy to the fabrication and in situ measurement of these systems. Jonathan graduated from the University of California, Riverside with a Ph.D. in Physics and received two undergraduate degrees: the first in Mathematics and Computer Science from Furman University, and the second in Physics from James Madison University.